White Light Interference Objective Lenses
Our white light interferometry objectives enable high-precision, non-contact 3D surface profiling. By interpreting interference fringes, they measure topography and defects for quality control in industries like aerospace, photovoltaics, and microelectronics.
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Mirau Interference Objective Lenses
Featuring a compact structure designed to deliver high-contrast interference fringes, our objective lenses ensure precise optical path alignment between the reference mirror and the sample surface. Compatible with all infinity-focus metallurgical microscopes, they are engineered to accurately measure surface topography even on objects with reflectivity as low as 0.5%.
Part Number | WLI-Mir-10X-0.25 | WLI-Mir-10X-0.3 | WLI-Mir-20X | WLI-Mir-50X | |
Magnification | 10X | 10X | 20X | 50X | |
Optical Design | Mirau | ||||
Numerical Aperture (NA) | 0.15 | 0.3 | 0.4 | 0.55 | |
Parfocal Distance (mm) | 45 | ||||
Working Distance (mm) | 7.4 | 7.4 | 3.5 | 1.7 | |
Focal Length (mm) | 20 | 20 | 10 | 4 | |
Depth Of Field (µm) | 10 | 10 | 3.5 | 1.4 | |
Resolution (µm) | 1.34 | 1.34 | 0.8 | 0.61 | |
Field Of View (mm) | ½”CCD | 0.65 x 0.45 (φ0.8) | 0.65 x 0.45 (φ0.8) | 0.33 x 0.23 (φ0.4) | 0.13 x 0.09 (φ0.16) |
½”CCD+0.5X | 1.3 x 0.9 (φ1.6) | 1.3 x 0.9 (φ1.6) | 0.65 x 0.45 (φ0.8) | 0.26 x 0.18 (φ0.32) | |
Diameter (mm) | 28 | 30 | 28 | 27.6 | |
Weight (g) | 85 | 114 | 102 | 110 | |
Operating Wavelength (nm) | 400~700nm | ||||
Sample Reflectivity (%) | ≥ 0.5% | ||||
Interface | 4/5X1/35’（M20.32X0.705） | ||||
Linnik Interference Objective Lenses
Featuring a Linnik structure design with two perfectly matched objectives, our interferometer lenses ensure identical optical path lengths for high-precision measurement. Compatible with infinity-focus microscopes and custom systems, they are designed for long working distances and can measure samples with reflectivity as low as 0.5%. The innovative white-light design delivers clear surface images and interference fringes, even on challenging samples.
Part Number | WLI-Lin-5X | WLI-Lin-10X | |
Magnification | 5X | 10X | |
Optical Design | Linnk | ||
Numerical Aperture (NA) | 0.12 | 0.25 | |
| Parfocal Distance (mm) | 80 | 80 | |
| Working Distance (mm) | 17 | 17 | |
| Depth Of Field (µm) | 40 | 10 | |
| Resolution (µm) | 1.34 | 1.34 | |
Field Of View (mm) | ½”CCD | 1.3×0.9 (φ1.6) | 0.65×0.45 (φ0.8) |
| ½”CCD+0.5X | 2.6X1.8 (φ3.2) | 1.3X0.9 (φ1.6) | |
Diameter（mm） | 28 | 30 | |
Weight（g） | 85 | 114 | |
Interface | 4/5×1/36’ | ||
Options | Parfocal 95mm Rotatable Adapter | ||
Michelson Interference Objective Lenses
Designed with a beam splitter integrated into a long-working-distance objective, our compact interferometer moves the reference mirror to the side for optimized performance. Compatible with all infinity-focus metallurgical microscopes, it delivers high-contrast interference fringes and can measure objects with reflectivity as low as 0.5%, making it ideal for applications requiring 5X magnification or less.
Part Number | WLI-Mich-5X | |
Magnification | 5X | |
Optical Design | Michelson | |
Numerical Aperture (NA) | 0.15 | |
Focal Length (mm) | 40 | |
Working Distance (mm) | 9 | |
Depth Of Field (µm) | 43 | |
Resolution (µm) | 2.8 | |
Field Of View (mm) | ½”CCD | 1.3×0.9 (φ1.6) |
½”CCD+0.5X | 2.6X1.8 (φ3.2) | |
Operating Wavelength | 400 – 700nm | |
Sample Reflectivity | ≥ 0.5% | |
Interface | 4/5X1/35’（M20.32X0.705） | |
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