EssentOptics Spectrophotometers
A spectrophotometer is an instrument used to measure light transmission/reflection at different wavelengths for samples. It is commonly used in the fields of chemistry, physics, biochemistry, and molecular biology.
A spectrophotometer works by passing a beam of light through a sample and measuring the amount of light that is absorbed or transmitted/reflected by the sample at different wavelengths. The basic components of a spectrophotometer include a light source, a monochromator or wavelength selector, a sample holder, and a detector.
EssentOptics develops high-accuracy spectrophotometers for coaters focusing exclusively on optical measuring needs. Wavelength Opto-Electronic is the partner of EssentOptics brand of spectrophotometers for Singapore.
PHOTON RT UV-VIS-MWIR
| MODEL | 0217 | 0226 | 0252 | |||
| OPTICAL CONFIGURATION | ||||||
|---|---|---|---|---|---|---|
| Photometric functions | %T, %R | |||||
| Effective wavelength range, nm | 185 – 1700 | 185 – 2600 | 185 – 5200 | |||
| Built-in polarizer, nm | 220 – 1700 | 220 – 2600 | 220 – 5200 | |||
| Optical scheme of monochromator | Czerny-Turner | |||||
| Optics | Mirror, MgF2 | |||||
| Reference channel | Yes | |||||
| Wavelength sampling pitch, nm | 0,25 – 100 | |||||
| Spot size on the measured sample, mm | 6 x 2 → 2 x 2 | |||||
| Turning pitch angle of sample stage | 0,01 deg | |||||
| Turning pitch angle of photodetectors | 0,01 deg | |||||
| Beam displacement compensation | -60,0 mm … 0 … +60,0 mm (actual value depends on detector position) | |||||
| Variable angle measurements | 1. 0 – 75 deg for transmittance (up to 85 deg with 7085 sample stage) | |||||
| Wavelength subranges, nm | Ultimate spectral resolution, nm (non-polarized light) | Wavelength accuracy, nm | Wavelength repeat accuracy, nm | |||
| 185 – 990 nm | 0,6 | +/- 0,5 | +/- 0,25 | |||
| 990 – 1700 / 2450 / 2600 nm | 1,2 | +/- 1,0 | +/- 0,5 | |||
| 2450 – 5200 nm | 2,4 | +/- 2,0 | +/- 1,0 | |||
| Stray light level, % at 532 nm | ˂ 0,1 | |||||
| Angle of beam divergence | +/-1 deg | |||||
Photometric accuracy (VIS-NIR range) Standard reference materials calibrated on a NIST-traceable spectrophotometer | (VIS-NIR) +/-0,0045 Abs (1 Abs); +/-0,0025 Abs (0,33 Abs); +/-0,0058 Abs (1.5 Abs) | |||||
Photometric repeat accuracy (VIS-NIR range) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements | (VIS-NIR) 0,0004 Abs (1 Abs); 0,0001 Abs (0,33 Abs); 0,005 Abs (1.5 Abs) | |||||
| Stability of baseline, %/hour (VIS range) | ˂ 0,1 (one hour warm-up time) | |||||
| Unattended polarization measurements with built-in polarizers | S, P, (S + P) / 2 | |||||
| Zero order / Green beam | Built-in, automatic | |||||
| Light sources, preinstalled | 1. Deuterium lamp: 1 ea | |||||
| Light sources, spare | Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered additionally | |||||
PHOTON RT 0420
| OPTICAL CONFIGURATION | |
| Optical scheme of monochromator | Double Additive Czerny-Turner |
| Optics | Mirror, protected Ag |
| Reference channel | Yes |
| Wavelength sampling pitch, nm | 0,01 to 100 |
| Spot size on the measured sample, mm | 4 x 3 |
| Photometric functions | %T, OD |
| Effective wavelength range, nm | 340 – 2000 |
Ultimate spectral resolution, nm 400-990 nm 990-2000 nm |
0,06 0,13 |
Wavelength accuracy, nm 400-990 nm 990-2000 nm |
+/- 0,02 +/- 0,04 |
Wavelength repeat accuracy, nm 400-990 nm 990-2000 nm |
+/- 0,01 +/- 0,02 |
Ultimate optical density, -log10(T) 340-420 nm 420-925 nm 925-2000 nm |
6 8 7 |
| Stray light level, % at 532 nm | < 0,000001 (1x10E-6) |
| Angle of beam divergence, deg | +/- 0,2 |
| Photometric accuracy | (VIS-NIR) |
| Photometric repeat accuracy | (VIS-NIR) 0,0004 Abs (1 Abs); 0,0001 Abs (0,33 Abs); 0,005 Abs (1.5 Abs) |
| Stability of baseline, %/hour | < 0,2 (one hour warm-up time) |
| Light sources | High energy plasma source, HgAr wavelength calibration lamp. All sources built-in and pre-configured |
PHOTON RT 7514 LWIR
| OPTICAL CONFIGURATION | |
| Photometric functions | %T, %R |
| Effective wavelength range, µm | 7,5 – 14,0 |
| Built-in polarizers, µm | 7,5 – 14,0 |
| Optical scheme of monochromator | Czerny-Turner |
| Optics | Mirror: Au, Lenses: ZnSe + AR |
| Measurement of Transmission | Variable angle measurements: 0 – 60 deg angles of incidence |
| Measurement of Reflection | Interchangeable sample stages with fixed angles of incidence: 10, 30, 45 and 60 deg Reference sample: gold mirror |
| Turning pitch angle of sample stage, deg | 0,01 |
| Beam displacement compensation, mm | 40 |
| Unattended polarization measurements with buil-in polarizers | S, P, (S + P) / 2 |
| Wavelength sampling pitch, nm | 5 – 100 |
| Spot size on measured sample (non-polarized light), mm | 2,0 x 6,0 (W x H) |
| Ultimate spectral resolution (non-polarized light), nm | 15 |
| Wavelength accuracy, nm | + / – 4,0 |
| Wavelength repeat accuracy, nm | + / – 2,0 |
| Photometric accuracy (Ge sample 3 mm thick, 47% T, λ0 = 10,6 µm, AOI = 40) | + / – 0,2% |
| Photometric repeat accuracy | + / – 0,1% |
| Stability of baseline (7,8 µm – 13,0 µm), % / hour* | + / – 0,3% |
| Stray light level ( 7,5 µm – 12,0 µm), % | < 0,2 |
| Light sources | IR lamp HgAr wavelenth calibration verification lamp |
LINZA 150
| MODEL | 0217 | 0417 |
PARAMETER | DESCRIPTION | |
|---|---|---|
| OPTICAL CONFIGURATION | ||
| Photometric functions | %T, %R | |
| Effective wavelength range, nm | 185 – 1700 | 380 – 1700 |
| Optical scheme of monochromator | Czerny-Turner | |
| Optics | Mirror, Al + SiO2, Al + MgF2 | |
| Reference channel | Yes | |
| Wavelength scanning speed, nm / min | 3000 (at 5 wavelength sampling pitch) | |
| Spot size on measured sample, mm | Transmittance: 6,0 x 5,5 Reflectance: 1,0 x 1,0 | |
| Wavelength sampling pitch, nm | 0,25 – 100 | |
Ultimate spectral resolution, nm 185 (380) – 990 nm 990 – 1700 nm |
2,00 4,00 |
2,00 4,00 |
| Wavelength accuracy, nm | 0,5 | |
| Wavelength repeat accuracy, nm | + / – 0,25 | |
| Scattered light level, % max (@ 532 nm) | < 0,1 | |
| Photometric accuracy | (VIS-NIR) +/-0,0045 Abs (1 Abs); +/-0,0025 Abs (0,33 Abs); +/-0,0058 Abs (1.5 Abs) | |
| Photometric repeat accuracy | (VIS-NIR) 0,0004 Abs (1 Abs); 0,0001 Abs (0,33 Abs); 0,005 Abs (1.5 Abs) | |
| Stability of baseline (UV-VIS), % / hour | < 0,1 | |
| Light sources | Deuterium lamp, Halogen lamp, HgAr wavelength calibration verification lamp | Halogen lamp, HgAr wavelength calibration verification lamp |
LINZA 2752 MWIR
| OPTICAL CONFIGURATION | |
| Photometric functions | %T |
| Effective wavelength range, nm | 2700 – 5200 |
| Optical scheme of monochromator | Czerny-Turner |
| Optics | Mirror: Al + MgF2, Lenses: CaF2 |
| Reference channel | Yes |
| Wavelength sampling pitch, nm | 0,5 – 100 |
| Wavelength scanning speed, nm / min | 3000 (at 5 wavelength sampling pitch) |
| Spot size on measured sample, mm | from 4.0 x 3.0 to 8.0 x 6.0 |
| Typical spectral resolution, nm* | 8,0 |
| Wavelength accuracy, nm | 4,0 |
| Wavelength repeat accuracy, nm | + / – 2,0 |
| Scattered light level, % max | 0,2 |
| Photometric accuracy** | NRC NG11 SRM; +/-0.010Abs (0,49Abs) +/-0.011Abs (0,82Abs) +/-0.013Abs (1,00Abs) +/-0.015Abs (1,26Abs) |
| Photometric repeat accuracy** | NRC NG11 SRM: +/-0.0016Abs (0,49Abs) +/-0.0036Abs (0,82Abs) +/-0.008Abs (1,00Abs) +/-0.013Abs (1,26Abs) |
| Stability of baseline, % / hour** | + / – 0,3 |
| Light sources | IR lamp |
EssentOptics Spectrophotometers Information
PHOTON RT
PHOTON RT is the world’s only spectrophotometer purpose-built for true optical coating metrology — enabling meaningful, traceable characterization of coatings under field-like operating conditions. It uniquely combines broadband polarization control and variable-angle measurements across an unmatched UV–MWIR range (220–5200 nm), providing deep insight into the real-world performance of multilayer thin-film optics.
PHOTON RT 420
Featuring an unprecedented 0.06 nm spectral resolution, the PHOTON RT 0420 Ultra delivers unmatched flexibility for performance qualification of cutting-edge filters. Its advanced capabilities enable broadband measurements down to OD8, with the ability to characterize slope steepness as small as 0.02%.
Designed to meet the rigorous demands of ultra coatings, the PHOTON RT 0420 Ultra features a wavelength range of 340nm to 2000nm and is tailored for a diverse range of coatings for advanced applications, including LIDARs, fluorescence microscopy, laser safety, telecom, space exploration, defense, and security.
PHOTON RT 7514 LWIR
Accurate and reliable infrared spectral measurements of optical coatings present one of the most critical challenges today. Optical manufacturers worldwide are specifying increasingly sophisticated IR coatings for their planar optics, aiming for improved long-distance object detection and identification. Often, production capabilities for obtaining these optical coatings outpace existing metrological capabilities for certifying their quality.
The PHOTON RT 7514 spectrophotometer is a purpose-built instrument specifically designed to effectively address these challenges. It measures the transmission and reflection of coatings for the LWIR spectral range. An unsurpassed feature of the PHOTON RT 7514 is its ability to perform automatic measurements at variable angles of incidence (up to 60 degrees) with polarized light. To support these demanding tests, a built-in feature accurately compensates for beam displacement at high angles, ensuring S- and P-polarization measurements are delivered in just a few minutes. A record maximum sample thickness of 40 mm is supported.
LINZA 150
The LINZA 150 spectrophotometer is designed for broadband transmittance and reflectance measurement of lenses and multi-lens assemblies (objectives), adding a whole new dimension to your optical metrology capabilities.
Indeed, lenses come in vast variety of sizes and shapes which makes them extremely difficult to measure. Given the inherent challenges in measuring transmittance or reflectance on lenses, optical engineers often need to combine data from a several witness samples in order to tease out basic details about optical performance of a lens. However, due to the nature of any deposition technology, the coating on lenses differs from that on the witness sample. Even more insurmountable barrier is the need to measure the off-axis performance of the optical lens .
With LINZA 150, you get transmission data on axis and reflection data at any point of the lens surface, fully unattended. This ensures that only perfect lenses with perfect coatings are delivered to customers and approved for lens assemblies. This valuable data also helps our customers to backward analyze and improve their deposition technology.
LINZA 150 Spectrophotometer is also a great instrument for your QA/QC lab ensuring that lenses from your supplier do meet your specs. The instrument is perfectly suited for both routine lens measurements and sophisticated improvement of lens coating technology.
LINZA 2752 MWIR
Most of the optical parts are lenses. Lenses come in vast variety of forms and sizes, both convex, concave, cylindrical and aspheric. Lenses are coated in vacuum chambers when placed on the fixture or planetary rotation holder.
Due to the nature of the vacuum deposition process there is no possibility to measure actual transmittance or reflectance on lenses in a real time. So flat witness samples are always used for process monitoring. However, the coating on lenses often differs from that on the witness sample. For many applications, it is critical to know transmission of the real lens. The actual optical performance can be often analyzed only once all lenses are installed in the optical system. It may take substantial time and efforts to identify the «bad» lens. These costs grow even higher for systems and objectives having multiple lenses. Needless to say, spectral performance of complete lens objectives also needs to be assessed!
LINZA 2752 spectrophotometer effectively addresses these challenges when it comes to on-axis transmission measurements of MWIR lenses and objectives. With its large compartment and sliding detectors, one can successfully measure individual lenes with diameter from 10 mm to 150 mm, and complete lens assemblies with end-to-end length up to 500 mm
For more products and information, visit our principal website.
