Spectrophotometer
- World’s first spectrophotometer designed for optical coaters
- World’s only instrument to feature UV-MWIR (185-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings
| PHOTON RT Spectrophotometer. Product Configuration | ||||||
|---|---|---|---|---|---|---|
| 185 – 1700 | 185 – 3500 | 185 – 5200 | 380 – 1700 | 380 – 3500 | 380 – 5200 | |
| PRODUCT SPECIFICATIONS | ||||||
| Optical scheme of monochromator | Czerny-Turner | |||||
| Optics | Mirror, MgF2 | |||||
| Reference channel | Yes | |||||
| Wavelength sampling pitch, nm | 0,1 – 100 | |||||
| Wavelength scanning speed, nm/min | 3 000 (at 5 nm wavelength sampling pitch) | |||||
| Spot size on the measured sample, nm | User selected: 5 х 2 –> 2 x 2 | |||||
| Turning pitch angle of sample stage | 0,01 deg | |||||
- Fast on-axis transmittance measurement of individual convex/concave lenses
- Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240 mm
- Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses
PARAMETER | DESCRIPTION |
|---|---|
SAMPLE COMPARTMENT * | |
Lens diameter, mm | Transmittance: 10 – 150 mm Reflectance: 10 – 90 mm |
Reflectance measurement | Lens radius: -15 mm … ∞ / +15 mm … ∞ |
Transmittance measurement | Focal length: -20 mm … ∞ … +20 mm |
Lens assembly dimensions, mm ** | Ø150 x 240 (L) |
Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm | 0,01 |
Maximum lens tilt angle (off-axis reflectance measurement), deg | 55 |
Angle of incidence (on-axis / off-axis reflectance measurement), deg | 12 |
OPTICAL CONFIGURATION | |
Effective wavelength range, nm | 380 – 1700, 185 – 1700 |
Optical scheme of monochromator | Czerny-Turner |
Optics | Mirror, Al + SiO2, Al + MgF2 |
Reference channel | Yes |
Wavelength sampling pitch, nm | 0,5 до 100 |
Wavelength scanning speed, nm/min | 3 000 (at 5 wavelength sampling pitch) |
Spot size on measured sample, mm | Transmittance: 4,0 х 2,5 mm Reflectance: 1,0 х 1,0 mm |
Photometric functions | %T, %R |
Spectral resolution, nm *** 185 (380) – 990 nm 990 – 1700 nm | 2,0 4,0 |
Wavelength accuracy, nm | 0,24 |
Wavelength repeat accuracy, nm | +/- 0,12 |
Scattered light level, % max (@ 532 nm) | < 0,1 |
Photometric accuracy | NIST SRM 930: +/-0.003 Abs (1 Abs) NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs) |
Photometric repeat accuracy | NIST SRM 930: 0.0006 Abs (1 Abs) NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
Stability of baseline (UV-VIS), %/hour **** | < 0,1 |
Light sources | Halogen lamp, Deuterium lamp, HgAr wavelength calibration verification lamp |
INTERFACE, DIMENSIONS AND WEIGHT | |
Interface | USB 2.0 |
Power consumption, Watt | 110 |
Power input | 110-220 VAC, 50-60 Hz |
Width x Depth x Height, mm | 680 х 440 х 360 (26 3/4 “ x 17 1/3 “ x 14 1/5”) |
Net weight, kg | 50 |
* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens. ** maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer *** provided for optimal signal-to-noise ratio **** after 1 hour warm-up time | |
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