Spectrophotometer

High-precision optical instruments to measure transmittance and reflectance on virtually any type of optical sample you can imagine

Photon RT (Flat Lenses)

LINZA 150 (Lens Assembly)

Photon RT (Flat Lenses)

World’s first spectrophotometer designed for optical coaters
World’s only instrument to feature UV-MWIR (185-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings

	PHOTON RT Spectrophotometer. Product Configuration
	185 – 1700	185 – 3500	185 – 5200	380 – 1700	380 – 3500	380 – 5200
PRODUCT SPECIFICATIONS
Optical scheme of monochromator	Czerny-Turner
Optics	Mirror, MgF2
Reference channel	Yes
Wavelength sampling pitch, nm	0,1 – 100
Wavelength scanning speed, nm/min	3 000 (at 5 nm wavelength sampling pitch)
Spot size on the measured sample, nm	User selected: 5 х 2 –> 2 x 2
Turning pitch angle of sample stage	0,01 deg

LINZA 150 (Lens Assembly)

Fast on-axis transmittance measurement of individual convex/concave lenses
Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240 mm
Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses

PARAMETER	DESCRIPTION
SAMPLE COMPARTMENT *
Lens diameter, mm	Transmittance: 10 – 150 mm Reflectance: 10 – 90 mm
Reflectance measurement	Lens radius: -15 mm … ∞ / +15 mm … ∞
Transmittance measurement	Focal length: -20 mm … ∞ … +20 mm
Lens assembly dimensions, mm **	Ø150 x 240 (L)
Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm	0,01
Maximum lens tilt angle (off-axis reflectance measurement), deg	55
Angle of incidence (on-axis / off-axis reflectance measurement), deg	12
OPTICAL CONFIGURATION
Effective wavelength range, nm	380 – 1700, 185 – 1700
Optical scheme of monochromator	Czerny-Turner
Optics	Mirror, Al + SiO2, Al + MgF2
Reference channel	Yes
Wavelength sampling pitch, nm	0,5 до 100
Wavelength scanning speed, nm/min	3 000 (at 5 wavelength sampling pitch)
Spot size on measured sample, mm	Transmittance: 4,0 х 2,5 mm Reflectance: 1,0 х 1,0 mm
Photometric functions	%T, %R
Spectral resolution, nm *** 185 (380) – 990 nm 990 – 1700 nm	2,0 4,0
Wavelength accuracy, nm	0,24
Wavelength repeat accuracy, nm	+/- 0,12
Scattered light level, % max (@ 532 nm)	< 0,1
Photometric accuracy	NIST SRM 930: +/-0.003 Abs (1 Abs) NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs)
Photometric repeat accuracy	NIST SRM 930: 0.0006 Abs (1 Abs) NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements
Stability of baseline (UV-VIS), %/hour ****	< 0,1
Light sources	Halogen lamp, Deuterium lamp, HgAr wavelength calibration verification lamp
INTERFACE, DIMENSIONS AND WEIGHT
Interface	USB 2.0
Power consumption, Watt	110
Power input	110-220 VAC, 50-60 Hz
Width x Depth x Height, mm	680 х 440 х 360 (26 3/4 “ x 17 1/3 “ x 14 1/5”)
Net weight, kg	50
* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens. maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer * provided for optimal signal-to-noise ratio **** after 1 hour warm-up time

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Spectrophotometer

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