Spectrophotometer

Photon RT (Flat Lenses)

Spectrophotometer

  • World’s first spectrophotometer designed for optical coaters
  • World’s only instrument to feature UV-MWIR (185-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings

LINZA 150 (Lens Assembly)

Spectrophotometer Linza

  • Fast on-axis transmittance measurement of individual convex/concave lenses 
  • Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240 mm
  • Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses

Photon RT (Flat Lenses)

 PHOTON RT Spectrophotometer. Product Configuration
 185 – 1700185 – 3500185 – 5200380 – 1700380 – 3500380 – 5200
PRODUCT SPECIFICATIONS
Optical scheme of monochromatorCzerny-Turner
OpticsMirror, MgF2
Reference channelYes
Wavelength sampling pitch, nm 0,1 – 100
Wavelength scanning speed, nm/min3 000 (at 5 nm wavelength sampling pitch)
Spot size on the measured sample, nmUser selected: 5 х 2 –> 2 x 2
Turning pitch angle of sample stage0,01 deg

LINZA 150 (Lens Assembly)

PARAMETER

DESCRIPTION

SAMPLE COMPARTMENT *

Lens diameter, mm

Transmittance: 10 – 150 mm

Reflectance: 10 – 90 mm

Reflectance measurement

Lens radius: -15 mm … ∞ / +15 mm … ∞

Transmittance measurement

Focal length: -20 mm … ∞ … +20 mm

Lens assembly dimensions, mm **

Ø150 x 240 (L)

Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm

0,01

Maximum lens tilt angle

(off-axis reflectance measurement), deg

55

Angle of incidence

(on-axis / off-axis reflectance measurement), deg

12

OPTICAL CONFIGURATION

Effective wavelength range, nm

380 – 1700, 185 – 1700

Optical scheme of monochromator

Czerny-Turner

Optics

Mirror, Al + SiO2, Al + MgF2

Reference channel

Yes

Wavelength sampling pitch, nm

0,5 до 100

Wavelength scanning speed, nm/min

3 000 (at 5 wavelength sampling pitch)

Spot size on measured sample, mm

Transmittance: 4,0 х 2,5 mm

Reflectance: 1,0 х 1,0 mm

Photometric functions

%T, %R

Spectral resolution, nm ***

185 (380) – 990 nm

990 – 1700 nm

 

2,0

4,0

Wavelength accuracy, nm

0,24

Wavelength repeat accuracy, nm

+/- 0,12

Scattered light level, % max (@ 532 nm)

< 0,1

Photometric accuracy

NIST SRM 930: +/-0.003 Abs (1 Abs)

NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs)

Photometric repeat accuracy

NIST SRM 930: 0.0006 Abs (1 Abs)

NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs)

Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements

Stability of baseline (UV-VIS), %/hour ****

< 0,1

Light sources

Halogen lamp, Deuterium lamp,

HgAr wavelength calibration verification lamp

INTERFACE, DIMENSIONS AND WEIGHT

Interface

USB 2.0

Power consumption, Watt

110

Power input

110-220 VAC, 50-60 Hz

Width x Depth x Height, mm

680 х 440 х 360 (26 3/4 “ x 17 1/3 “ x 14 1/5”)

Net weight, kg

50

* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens.

** maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer

*** provided for optimal signal-to-noise ratio

**** after 1 hour warm-up time

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