FLUXiM Solar Cells & OLEDs

• Setfos

Setfos simulates OLEDs from charge injection to light extraction. The graphical user interface makes it easy to analyze and improve your devices. Modeling OLEDs from the material selection to the definition of the most efficient stack.

• Laoss

Laoss (large-area organic semiconductor simulation) is a powerful software package for the design, simulation, and optimization of large-area organic and perovskite solar cells and LEDs (displays, lighting panels, photovoltaic arrays).

• Paios

Paios performs a large variety of electrical and optical characterizations on organic, perovskite, and quantum-dot LEDs and solar cells with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your R&D.

• Phelos

Phelos is an angular luminescence spectrometer to characterize light-emitting devices and thin films over varied emission and polarization angles. While traditional goniometric instruments focus on either electroluminescence (EL) or photoluminescence (PL), Phelos incorporates both measuring techniques in one table-top compact instrument. The Phelos software can be easily coupled to the powerful simulation software Setfos for data analysis, parameter extraction, and device modeling.

• Litos

Litos is an advanced solar cell and LED stability lifetime measurement system. It has 32 parallel stressing channels distributed over 4 airtight weathering chambers. Each chamber has an individual temperature and illumination control. The wide range of stress conditions inside a highly-controlled experimental environment, full automation, and the possibility of interfacing Litos with Paios for in-depth degradation analysis make it a primary choice for researchers that want to understand the degradation behavior of organic, perovskite and quantum-dots based LEDs and solar cells.

• Litos-Lite

Litos-Lite is a platform to perform parallel JV and stability measurements on organic and perovskite solar cells. This innovative characterization hardware is able to perform JV measurements on up to 56 parallel channels and stress the solar cells with either constant voltage or current. Individual MPP tracking is possible on each of the devices under stress. The temperature of the samples can be controlled to a maximum value of T = 150 °C.