EssentOptics Spectrophotometers

EssentOptics Spectrophotometers

EssentOptics develops high-accuracy spectrophotometers for coaters focusing exclusively on optical measuring needs. Wavelength Opto-Electronic is the authorised distributor of EssentOptics brand of products in Singapore.

  • World's first spectrophotometer designed for optical coaters
  • World's only instrument to feature UV-MWIR (220-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings
 PHOTON RT Spectrophotometer. Product Configuration
 185 - 1700185 - 3500185 - 5200380 - 1700380 - 3500380 - 5200
PRODUCT SPECIFICATIONS
Optical scheme of monochromatorCzerny-Turner
OpticsMirror, MgF2
Reference channelYes
Wavelength sampling pitch, nm 0,1 - 100
Wavelength scanning speed, nm/min3 000 (at 5 nm wavelength sampling pitch)
Spot size on the measured sample, nmUser selected: 6 х 2 --> 2 x 2
Turning pitch angle of sample stage0,01 deg
Turning pitch angle of photodetectors0,01 deg
Beam displacement compensation-60,0 mm ... 0 ... +60,0 mm (actual value depends on detector position)
Variable angle measurements

1. 0 - 75 deg for transmittance (up to 85 deg with 70 - 85 sample stage)

2. 8 - 75 deg for absolute reflectance (up to 85 deg with 70 - 85 sample stage)

3. Detector rotation range: 300 deg ... 180 deg ... 16 deg

4. Sample stage rotation range: -85 deg ... 0 deg ... +85 deg

Wavelength subranges, nmUltimate spectral resolution, nm (non-polarized light)Wavelength accuracy, nmWavelength repeat accuracy, nm
185 - 350 nm0,3+/-0,25+/-0,125
350 (380) - 990 nm0,6+/-0,5+/-0,25
990 - 1650 nm1,2+/-1,0+/-0,5
1650 - 2450 nm1,2+/-1,0+/-0,5
2450 - 5200 nm2,4+/-2,0+/-2,0
Stray light level, % at 532 nm˂0,1
Angle of beam divergence+/-1 deg
Photometric accuracy

(VIS)

NIST SRM 930e: +/-0,003 Abs (1Abs)

NIST SRM 1930: +/-0,003 Abs (0.33Abs); +/-0,006 Abs (2Abs)

(MWIR)

NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs)

Photometric repeat accuracy (VIS range)

(VIS)

NIST SRM 930e: 0,0004 Abs (1 Abs)

NIST SRM 1930: 0,0001 Abs (0,33 Abs); 0,005 Abs (2 Abs)

(MWIR)

NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs)

Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements

Stability of baseline, %/hour (VIS range)˂0,1 (one hour warm-up time)
Unattended polarization measurements with built-in polarizers

a. S, P, (S + P)/2, Random

b. User defined S:P ratio for incident beam (20/80, 30/70 etc)

Built-in polarizers, nm220 - 1700220 - 3500220 - 5200380 - 1700380 - 3500380 - 5200
Zero order / Green beamBuilt-in, automatic
Light sources, preinstalled

1. Halogen lamp: 1 ea

2. HgAr wavelength calibration verification lamp: 1 ea

 Deuterium lamp: 1 eaDeuterium lamp: 1 eaDeuterium lamp: 1 ea   
   IR source: 1 ea  IR source: 1 ea
Light sources, spareHalogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered
SAMPLE COMPARTMENT
Dovetail baseplate for sample stagesDesigned for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage
Planar sample stage

For measurement of transmission and reflection of planar samples with size bigger than 12,0 x 10,0 mm

Independent positioning

Independent computer controlled positioning of sample stage and photodetectors unit

Synchronized positioningSynchronized computer controlled positioning of sample stage and photodetectors unit dependingon the selected photometric function 
Size of samples

Min. 12,0 x 10,0 mm - for measurement at 0 - 10 deg incidence angles

Min. 12,0 x 25,0 mm - for measurement at 10 - 75 deg incidence angles

Max. sample size:

  • up to 152,4 mm (6") with closed lid for standard sample stage
  • up to 140,0 mm (5 1/2") with closed lid for Z sample stage
Sample stage for PBS cubes50,0 x 50,0 x 50,0 mm sample stage with two additional cube holders 1" x 1" x 1" and 1/2" x 1/2" x 1/2"
Optional motorized and non-motorized sample stage

1. Multiposition Stage base, motorized, auto-detect

1.1 1" / 8 position disk for multiposition stage base

1.2 30,0 mm / 8 position disk for multiposition stage base

2. XY Stage. +/-12,5 mm travel. Sample size 40,0 x 44,0 mm

3. Z Stage

4. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 1)

5. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 2)

USER INTERFACE, DIMENSIONS AND WEIGHT
InterfaceUSB 2.0, Windows-based, English
File saving formatsres (txt), xls, pdf, csv
Power consumption, Watt110
Power input110 - 220 V (+/-10%), 50 - 60 Hz
Ambient temperature conditions+19 ... +26 deg C
Width х Depth х Height, mm (inches)422,0 х 656,0 х 285,0 (16 3/5" х 25 4/5" х 11 4/5"), including handle and feet
Net weight, kg (lbs)50 (110)

  • Fast on-axis transmittance measurement of individual convex/concave lenses 
  • Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240,0 mm
  • Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses

PARAMETER

DESCRIPTION

SAMPLE COMPARTMENT *

Lens diameter, mm

Transmittance: 10,0 - 150,0 mm

Reflectance: 10,0 - 90,0 mm

Reflectance measurement

Lens radius: -15,0 mm … ∞ / +15,0 mm … ∞

Transmittance measurement

Focal length: -20,0 mm ... ∞ ... +20,0 mm

Lens assembly dimensions, mm **

Ø150 x 240 (L)

Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm

0,01

Maximum lens tilt angle

(off-axis reflectance measurement), deg

55

Angle of incidence

(on-axis / off-axis reflectance measurement), deg

12

OPTICAL CONFIGURATION

Effective wavelength range, nm

380 - 1700, 185 - 1700

Optical scheme of monochromator

Czerny-Turner

Optics

Mirror, Al + SiO2, Al + MgF2

Reference channel

Yes

Wavelength sampling pitch, nm

0,5 до 100

Wavelength scanning speed, nm/min

3 000 (at 5 wavelength sampling pitch)

Spot size on measured sample, mm

Transmittance: 4,0 х 2,5 mm

Reflectance: 1,0 х 1,0 mm

Photometric functions

%T, %R

Spectral resolution, nm ***

185 (380) – 990 nm

990 – 1700 nm

2,0

4,0

Wavelength accuracy, nm

0,24

Wavelength repeat accuracy, nm

+/- 0,12

Scattered light level, % max (@ 532 nm)

< 0,1

Photometric accuracy

NIST SRM 930: +/-0.003 Abs (1 Abs)

NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs)

Photometric repeat accuracy

NIST SRM 930: 0.0006 Abs (1 Abs)

NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs)

Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements

Stability of baseline (UV-VIS), %/hour ****

< 0,1

Light sources

Halogen lamp, Deuterium lamp,

HgAr wavelength calibration verification lamp

INTERFACE, DIMENSIONS AND WEIGHT

Interface

USB 2.0

Power consumption, Watt

110

Power input

110-220 VAC, 50-60 Hz

Width x Depth x Height, mm

680,0 х 440,0 х 360,0 (26 3/4 “ x 17 1/3 “ x 14 1/5”)

Net weight, kg

50

* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens.

** maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer

*** provided for optimal signal-to-noise ratio

**** after 1 hour warm-up time

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SPIE Photonics West, 31 Jan - 2 Feb | Booth: 2452
SPIE Defense + Commercial Sensing
, 2 - 4 May | Booth: 1320
Laser World of Photonics, 27-30 June | Hall: B1 Booth: 422
Laser World of Photonics India, 13-15 September | Hall: 3 Booth: LF15
DSEI, 12-15 September | Booth: Manufacturing Pod 7
Exhibitions
  • SPIE Photonics West 2023, 31 Jan - 2 Feb | Booth: 2452
  • SPIE Defense + Commercial Sensing 2023, 2 - 4 May | Booth 1320
  • Laser World of Photonics, 27-30 June | Hall B1 Booth 422