EssentOptics Spectrophotometers
A spectrophotometer is an instrument used to measure light transmission/reflection at different wavelengths for samples. It is commonly used in the fields of chemistry, physics, biochemistry, and molecular biology.
A spectrophotometer works by passing a beam of light through a sample and measuring the amount of light that is absorbed or transmitted/reflected by the sample at different wavelengths. The basic components of a spectrophotometer include a light source, a monochromator or wavelength selector, a sample holder, and a detector.
EssentOptics develops high-accuracy spectrophotometers for coaters focusing exclusively on optical measuring needs. Wavelength Opto-Electronic is the partner of EssentOptics brand of spectrophotometers for Singapore.
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Products
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Descriptions
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Request for Quotation
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PHOTON RT
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LINZA 150
| PHOTON RT Spectrophotometer. Product Configuration | ||||||
|---|---|---|---|---|---|---|
| 185 - 1700 | 185 - 3500 | 185 - 5200 | 380 - 1700 | 380 - 3500 | 380 - 5200 | |
| PRODUCT SPECIFICATIONS | ||||||
| Optical scheme of monochromator | Czerny-Turner | |||||
| Optics | Mirror, MgF2 | |||||
| Reference channel | Yes | |||||
| Wavelength sampling pitch, nm | 0,1 - 100 | |||||
| Wavelength scanning speed, nm/min | 3 000 (at 5 nm wavelength sampling pitch) | |||||
| Spot size on the measured sample, nm | User selected: 6 х 2 --> 2 x 2 | |||||
| Turning pitch angle of sample stage | 0,01 deg | |||||
| Turning pitch angle of photodetectors | 0,01 deg | |||||
| Beam displacement compensation | -60,0 mm ... 0 ... +60,0 mm (actual value depends on detector position) | |||||
| Variable angle measurements | 1. 0 - 75 deg for transmittance (up to 85 deg with 70 - 85 sample stage) 2. 8 - 75 deg for absolute reflectance (up to 85 deg with 70 - 85 sample stage) 3. Detector rotation range: 300 deg ... 180 deg ... 16 deg 4. Sample stage rotation range: -85 deg ... 0 deg ... +85 deg | |||||
| Wavelength subranges, nm | Ultimate spectral resolution, nm (non-polarized light) | Wavelength accuracy, nm | Wavelength repeat accuracy, nm | |||
| 185 - 350 nm | 0,3 | +/-0,25 | +/-0,125 | |||
| 350 (380) - 990 nm | 0,6 | +/-0,5 | +/-0,25 | |||
| 990 - 1650 nm | 1,2 | +/-1,0 | +/-0,5 | |||
| 1650 - 2450 nm | 1,2 | +/-1,0 | +/-0,5 | |||
| 2450 - 5200 nm | 2,4 | +/-2,0 | +/-2,0 | |||
| Stray light level, % at 532 nm | ˂0,1 | |||||
| Angle of beam divergence | +/-1 deg | |||||
| Photometric accuracy | (VIS) NIST SRM 930e: +/-0,003 Abs (1Abs) NIST SRM 1930: +/-0,003 Abs (0.33Abs); +/-0,006 Abs (2Abs) (MWIR) NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs) | |||||
| Photometric repeat accuracy (VIS range) | (VIS) NIST SRM 930e: 0,0004 Abs (1 Abs) NIST SRM 1930: 0,0001 Abs (0,33 Abs); 0,005 Abs (2 Abs) (MWIR) NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements | |||||
| Stability of baseline, %/hour (VIS range) | ˂0,1 (one hour warm-up time) | |||||
| Unattended polarization measurements with built-in polarizers | a. S, P, (S + P)/2, Random b. User defined S:P ratio for incident beam (20/80, 30/70 etc) | |||||
| Built-in polarizers, nm | 220 - 1700 | 220 - 3500 | 220 - 5200 | 380 - 1700 | 380 - 3500 | 380 - 5200 |
| Zero order / Green beam | Built-in, automatic | |||||
| Light sources, preinstalled | 1. Halogen lamp: 1 ea 2. HgAr wavelength calibration verification lamp: 1 ea | |||||
| Deuterium lamp: 1 ea | Deuterium lamp: 1 ea | Deuterium lamp: 1 ea | ||||
| IR source: 1 ea | IR source: 1 ea | |||||
| Light sources, spare | Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered | |||||
| PARAMETER | DESCRIPTION |
|---|---|
| SAMPLE COMPARTMENT * | |
| Lens diameter, mm | Transmittance: 10,0 - 150,0 mm Reflectance: 10,0 - 90,0 mm |
| Reflectance measurement | Lens radius: -15,0 mm … ∞ / +15,0 mm … ∞ |
| Transmittance measurement | Focal length: -20,0 mm ... ∞ ... +20,0 mm |
| Lens assembly dimensions, mm ** | Ø150 x 240 (L) |
| Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm | 0,01 |
Maximum lens tilt angle (off-axis reflectance measurement), deg | 55 |
Angle of incidence (on-axis / off-axis reflectance measurement), deg | 12 |
| OPTICAL CONFIGURATION | |
| Effective wavelength range, nm | 380 - 1700, 185 - 1700 |
| Optical scheme of monochromator | Czerny-Turner |
| Optics | Mirror, Al + SiO2, Al + MgF2 |
| Reference channel | Yes |
| Wavelength sampling pitch, nm | 0,5 до 100 |
| Wavelength scanning speed, nm/min | 3 000 (at 5 wavelength sampling pitch) |
| Spot size on measured sample, mm | Transmittance: 4,0 х 2,5 mm Reflectance: 1,0 х 1,0 mm |
| Photometric functions | %T, %R |
Spectral resolution, nm *** 185 (380) – 990 nm 990 – 1700 nm | 2,0 4,0 |
| Wavelength accuracy, nm | 0,24 |
| Wavelength repeat accuracy, nm | +/- 0,12 |
| Scattered light level, % max (@ 532 nm) | < 0,1 |
| Photometric accuracy | NIST SRM 930: +/-0.003 Abs (1 Abs) NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs) |
| Photometric repeat accuracy | NIST SRM 930: 0.0006 Abs (1 Abs) NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
| Stability of baseline (UV-VIS), %/hour **** | < 0,1 |
| Light sources | Halogen lamp, Deuterium lamp, HgAr wavelength calibration verification lamp |
| INTERFACE, DIMENSIONS AND WEIGHT | |
| Interface | USB 2.0 |
| Power consumption, Watt | 110 |
| Power input | 110-220 VAC, 50-60 Hz |
| Width x Depth x Height, mm | 680,0 х 440,0 х 360,0 (26 3/4 “ x 17 1/3 “ x 14 1/5”) |
| Net weight, kg | 50 |
- PHOTON RT
The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is designed specifically for unattended measurement of optical samples with coatings. The instrument is produced in six configurations relative to the effective wavelength range - from 185 nm up to 5200 nm.
- LINZA 150
The LINZA 150 spectrophotometer is designed for broadband transmittance and reflectance measurement of lenses and lens assemblies (objectives), adding a whole new dimension to your optical metrology capabilities.
Indeed, lenses come in a vast variety of sizes and shapes which makes them extremely difficult to measure. Given the inherent challenges in measuring transmittance or reflectance on lenses, optical engineers often need to combine data from several witness samples in order to tease out basic details about the optical performance of a lens. However, due to the nature of any deposition technology, the coating on lenses differs from that on the witness sample. An even more insurmountable barrier is the need to measure the off-axis performance of the optical lens.
With LINZA 150, you get transmission data on the axis and reflection data at any point of the lens surface, fully unattended. This ensures that only perfect lenses with perfect coatings are delivered to customers and approved for lens assemblies. This valuable data also helps our customers to backward analyze and improve their deposition technology.
LINZA 150 Spectrophotometer is also a great instrument for your QA/QC lab ensuring that lenses from your supplier meet your specs. The instrument is perfectly suited for both routine lens measurements and sophisticated improvement of lens coating technology.
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