EssentOptics Spectrophotometers

EssentOptics develops high-accuracy spectrophotometers for coaters focusing exclusively on optical measuring needs. Wavelength Opto-Electronic is the authorised distributor of EssentOptics brand of products in Singapore.

PHOTON RT
LINZA 150
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World's first spectrophotometer designed for optical coaters
World's only instrument to feature UV-MWIR (220-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings

	PHOTON RT Spectrophotometer. Product Configuration
	185 - 1700	185 - 3500	185 - 5200	380 - 1700	380 - 3500	380 - 5200
PRODUCT SPECIFICATIONS
Optical scheme of monochromator	Czerny-Turner
Optics	Mirror, MgF2
Reference channel	Yes
Wavelength sampling pitch, nm	0,1 - 100
Wavelength scanning speed, nm/min	3 000 (at 5 nm wavelength sampling pitch)
Spot size on the measured sample, nm	User selected: 6 х 2 --> 2 x 2
Turning pitch angle of sample stage	0,01 deg
Turning pitch angle of photodetectors	0,01 deg
Beam displacement compensation	-60,0 mm ... 0 ... +60,0 mm (actual value depends on detector position)
Variable angle measurements	1. 0 - 75 deg for transmittance (up to 85 deg with 70 - 85 sample stage) 2. 8 - 75 deg for absolute reflectance (up to 85 deg with 70 - 85 sample stage) 3. Detector rotation range: 300 deg ... 180 deg ... 16 deg 4. Sample stage rotation range: -85 deg ... 0 deg ... +85 deg
Wavelength subranges, nm	Ultimate spectral resolution, nm (non-polarized light)		Wavelength accuracy, nm		Wavelength repeat accuracy, nm
185 - 350 nm	0,3		+/-0,25		+/-0,125
350 (380) - 990 nm	0,6		+/-0,5		+/-0,25
990 - 1650 nm	1,2		+/-1,0		+/-0,5
1650 - 2450 nm	1,2		+/-1,0		+/-0,5
2450 - 5200 nm	2,4		+/-2,0		+/-2,0
Stray light level, % at 532 nm	˂0,1
Angle of beam divergence	+/-1 deg
Photometric accuracy	(VIS) NIST SRM 930e: +/-0,003 Abs (1Abs) NIST SRM 1930: +/-0,003 Abs (0.33Abs); +/-0,006 Abs (2Abs) (MWIR) NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs)
Photometric repeat accuracy (VIS range)	(VIS) NIST SRM 930e: 0,0004 Abs (1 Abs) NIST SRM 1930: 0,0001 Abs (0,33 Abs); 0,005 Abs (2 Abs) (MWIR) NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements
Stability of baseline, %/hour (VIS range)	˂0,1 (one hour warm-up time)
Unattended polarization measurements with built-in polarizers	a. S, P, (S + P)/2, Random b. User defined S:P ratio for incident beam (20/80, 30/70 etc)
Built-in polarizers, nm	220 - 1700	220 - 3500	220 - 5200	380 - 1700	380 - 3500	380 - 5200
Zero order / Green beam	Built-in, automatic
Light sources, preinstalled	1. Halogen lamp: 1 ea 2. HgAr wavelength calibration verification lamp: 1 ea
	Deuterium lamp: 1 ea	Deuterium lamp: 1 ea	Deuterium lamp: 1 ea
			IR source: 1 ea			IR source: 1 ea
Light sources, spare	Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered
SAMPLE COMPARTMENT
Dovetail baseplate for sample stages	Designed for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage
Planar sample stage	For measurement of transmission and reflection of planar samples with size bigger than 12,0 x 10,0 mm
Independent positioning	Independent computer controlled positioning of sample stage and photodetectors unit
Synchronized positioning	Synchronized computer controlled positioning of sample stage and photodetectors unit dependingon the selected photometric function
Size of samples	Min. 12,0 x 10,0 mm - for measurement at 0 - 10 deg incidence angles Min. 12,0 x 25,0 mm - for measurement at 10 - 75 deg incidence angles Max. sample size: up to 152,4 mm (6") with closed lid for standard sample stage up to 140,0 mm (5 1/2") with closed lid for Z sample stage
Sample stage for PBS cubes	50,0 x 50,0 x 50,0 mm sample stage with two additional cube holders 1" x 1" x 1" and 1/2" x 1/2" x 1/2"
Optional motorized and non-motorized sample stage	1. Multiposition Stage base, motorized, auto-detect 1.1 1" / 8 position disk for multiposition stage base 1.2 30,0 mm / 8 position disk for multiposition stage base 2. XY Stage. +/-12,5 mm travel. Sample size 40,0 x 44,0 mm 3. Z Stage 4. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 1) 5. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 2)
USER INTERFACE, DIMENSIONS AND WEIGHT
Interface	USB 2.0, Windows-based, English
File saving formats	res (txt), xls, pdf, csv
Power consumption, Watt	110
Power input	110 - 220 V (+/-10%), 50 - 60 Hz
Ambient temperature conditions	+19 ... +26 deg C
Width х Depth х Height, mm (inches)	422,0 х 656,0 х 285,0 (16 3/5" х 25 4/5" х 11 4/5"), including handle and feet
Net weight, kg (lbs)	50 (110)

Fast on-axis transmittance measurement of individual convex/concave lenses
Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240,0 mm
Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses

PARAMETER	DESCRIPTION
SAMPLE COMPARTMENT *
Lens diameter, mm	Transmittance: 10,0 - 150,0 mm Reflectance: 10,0 - 90,0 mm
Reflectance measurement	Lens radius: -15,0 mm … ∞ / +15,0 mm … ∞
Transmittance measurement	Focal length: -20,0 mm ... ∞ ... +20,0 mm
Lens assembly dimensions, mm **	Ø150 x 240 (L)
Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm	0,01
Maximum lens tilt angle (off-axis reflectance measurement), deg	55
Angle of incidence (on-axis / off-axis reflectance measurement), deg	12
OPTICAL CONFIGURATION
Effective wavelength range, nm	380 - 1700, 185 - 1700
Optical scheme of monochromator	Czerny-Turner
Optics	Mirror, Al + SiO2, Al + MgF2
Reference channel	Yes
Wavelength sampling pitch, nm	0,5 до 100
Wavelength scanning speed, nm/min	3 000 (at 5 wavelength sampling pitch)
Spot size on measured sample, mm	Transmittance: 4,0 х 2,5 mm Reflectance: 1,0 х 1,0 mm
Photometric functions	%T, %R
Spectral resolution, nm *** 185 (380) – 990 nm 990 – 1700 nm	2,0 4,0
Wavelength accuracy, nm	0,24
Wavelength repeat accuracy, nm	+/- 0,12
Scattered light level, % max (@ 532 nm)	< 0,1
Photometric accuracy	NIST SRM 930: +/-0.003 Abs (1 Abs) NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs)
Photometric repeat accuracy	NIST SRM 930: 0.0006 Abs (1 Abs) NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements
Stability of baseline (UV-VIS), %/hour ****	< 0,1
Light sources	Halogen lamp, Deuterium lamp, HgAr wavelength calibration verification lamp
INTERFACE, DIMENSIONS AND WEIGHT
Interface	USB 2.0
Power consumption, Watt	110
Power input	110-220 VAC, 50-60 Hz
Width x Depth x Height, mm	680,0 х 440,0 х 360,0 (26 3/4 “ x 17 1/3 “ x 14 1/5”)
Net weight, kg	50
* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens. maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer * provided for optimal signal-to-noise ratio **** after 1 hour warm-up time

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