
EssentOptics Spectrophotometers
EssentOptics develops high-accuracy spectrophotometers for coaters focusing exclusively on optical measuring needs. Wavelength Opto-Electronic is the authorised distributor of EssentOptics brand of products in Singapore.
- PHOTON RT
- LINZA 150
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- World's first spectrophotometer designed for optical coaters
- World's only instrument to feature UV-MWIR (220-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings
PHOTON RT Spectrophotometer. Product Configuration | ||||||
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185 - 1700 | 185 - 3500 | 185 - 5200 | 380 - 1700 | 380 - 3500 | 380 - 5200 | |
PRODUCT SPECIFICATIONS | ||||||
Optical scheme of monochromator | Czerny-Turner | |||||
Optics | Mirror, MgF2 | |||||
Reference channel | Yes | |||||
Wavelength sampling pitch, nm | 0,1 - 100 | |||||
Wavelength scanning speed, nm/min | 3 000 (at 5 nm wavelength sampling pitch) | |||||
Spot size on the measured sample, nm | User selected: 6 х 2 --> 2 x 2 | |||||
Turning pitch angle of sample stage | 0,01 deg | |||||
Turning pitch angle of photodetectors | 0,01 deg | |||||
Beam displacement compensation | -60,0 mm ... 0 ... +60,0 mm (actual value depends on detector position) | |||||
Variable angle measurements | 1. 0 - 75 deg for transmittance (up to 85 deg with 70 - 85 sample stage) 2. 8 - 75 deg for absolute reflectance (up to 85 deg with 70 - 85 sample stage) 3. Detector rotation range: 300 deg ... 180 deg ... 16 deg 4. Sample stage rotation range: -85 deg ... 0 deg ... +85 deg | |||||
Wavelength subranges, nm | Ultimate spectral resolution, nm (non-polarized light) | Wavelength accuracy, nm | Wavelength repeat accuracy, nm | |||
185 - 350 nm | 0,3 | +/-0,25 | +/-0,125 | |||
350 (380) - 990 nm | 0,6 | +/-0,5 | +/-0,25 | |||
990 - 1650 nm | 1,2 | +/-1,0 | +/-0,5 | |||
1650 - 2450 nm | 1,2 | +/-1,0 | +/-0,5 | |||
2450 - 5200 nm | 2,4 | +/-2,0 | +/-2,0 | |||
Stray light level, % at 532 nm | ˂0,1 | |||||
Angle of beam divergence | +/-1 deg | |||||
Photometric accuracy | (VIS) NIST SRM 930e: +/-0,003 Abs (1Abs) NIST SRM 1930: +/-0,003 Abs (0.33Abs); +/-0,006 Abs (2Abs) (MWIR) NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs) | |||||
Photometric repeat accuracy (VIS range) | (VIS) NIST SRM 930e: 0,0004 Abs (1 Abs) NIST SRM 1930: 0,0001 Abs (0,33 Abs); 0,005 Abs (2 Abs) (MWIR) NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements | |||||
Stability of baseline, %/hour (VIS range) | ˂0,1 (one hour warm-up time) | |||||
Unattended polarization measurements with built-in polarizers | a. S, P, (S + P)/2, Random b. User defined S:P ratio for incident beam (20/80, 30/70 etc) | |||||
Built-in polarizers, nm | 220 - 1700 | 220 - 3500 | 220 - 5200 | 380 - 1700 | 380 - 3500 | 380 - 5200 |
Zero order / Green beam | Built-in, automatic | |||||
Light sources, preinstalled | 1. Halogen lamp: 1 ea 2. HgAr wavelength calibration verification lamp: 1 ea | |||||
Deuterium lamp: 1 ea | Deuterium lamp: 1 ea | Deuterium lamp: 1 ea | ||||
IR source: 1 ea | IR source: 1 ea | |||||
Light sources, spare | Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered | |||||
SAMPLE COMPARTMENT | ||||||
Dovetail baseplate for sample stages | Designed for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage | |||||
Planar sample stage | For measurement of transmission and reflection of planar samples with size bigger than 12,0 x 10,0 mm | |||||
Independent positioning | Independent computer controlled positioning of sample stage and photodetectors unit | |||||
Synchronized positioning | Synchronized computer controlled positioning of sample stage and photodetectors unit dependingon the selected photometric function | |||||
Size of samples | Min. 12,0 x 10,0 mm - for measurement at 0 - 10 deg incidence angles Min. 12,0 x 25,0 mm - for measurement at 10 - 75 deg incidence angles Max. sample size:
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Sample stage for PBS cubes | 50,0 x 50,0 x 50,0 mm sample stage with two additional cube holders 1" x 1" x 1" and 1/2" x 1/2" x 1/2" | |||||
Optional motorized and non-motorized sample stage | 1. Multiposition Stage base, motorized, auto-detect 1.1 1" / 8 position disk for multiposition stage base 1.2 30,0 mm / 8 position disk for multiposition stage base 2. XY Stage. +/-12,5 mm travel. Sample size 40,0 x 44,0 mm 3. Z Stage 4. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 1) 5. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 2) | |||||
USER INTERFACE, DIMENSIONS AND WEIGHT | ||||||
Interface | USB 2.0, Windows-based, English | |||||
File saving formats | res (txt), xls, pdf, csv | |||||
Power consumption, Watt | 110 | |||||
Power input | 110 - 220 V (+/-10%), 50 - 60 Hz | |||||
Ambient temperature conditions | +19 ... +26 deg C | |||||
Width х Depth х Height, mm (inches) | 422,0 х 656,0 х 285,0 (16 3/5" х 25 4/5" х 11 4/5"), including handle and feet | |||||
Net weight, kg (lbs) | 50 (110) |
- Fast on-axis transmittance measurement of individual convex/concave lenses
- Fast on-axis transmittance measurement of lens assemblies (objectives) with maximum objective length of 240,0 mm
- Unattended on-axis and off-axis reflectance measurement of individual lenses providing measurement data virtually from any area on lens surface (both convex and concave). Ideal for fine-tuning of deposition technology used to produce coatings on lenses
PARAMETER | DESCRIPTION |
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SAMPLE COMPARTMENT * | |
Lens diameter, mm | Transmittance: 10,0 - 150,0 mm Reflectance: 10,0 - 90,0 mm |
Reflectance measurement | Lens radius: -15,0 mm … ∞ / +15,0 mm … ∞ |
Transmittance measurement | Focal length: -20,0 mm ... ∞ ... +20,0 mm |
Lens assembly dimensions, mm ** | Ø150 x 240 (L) |
Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm | 0,01 |
Maximum lens tilt angle (off-axis reflectance measurement), deg | 55 |
Angle of incidence (on-axis / off-axis reflectance measurement), deg | 12 |
OPTICAL CONFIGURATION | |
Effective wavelength range, nm | 380 - 1700, 185 - 1700 |
Optical scheme of monochromator | Czerny-Turner |
Optics | Mirror, Al + SiO2, Al + MgF2 |
Reference channel | Yes |
Wavelength sampling pitch, nm | 0,5 до 100 |
Wavelength scanning speed, nm/min | 3 000 (at 5 wavelength sampling pitch) |
Spot size on measured sample, mm | Transmittance: 4,0 х 2,5 mm Reflectance: 1,0 х 1,0 mm |
Photometric functions | %T, %R |
Spectral resolution, nm *** 185 (380) – 990 nm 990 – 1700 nm | 2,0 4,0 |
Wavelength accuracy, nm | 0,24 |
Wavelength repeat accuracy, nm | +/- 0,12 |
Scattered light level, % max (@ 532 nm) | < 0,1 |
Photometric accuracy | NIST SRM 930: +/-0.003 Abs (1 Abs) NIST SRM 1930: +/-0.003 Abs (0.33 Abs); +/-0.006 Abs (2 Abs) |
Photometric repeat accuracy | NIST SRM 930: 0.0006 Abs (1 Abs) NIST SRM 1930: 0.0002 Abs (0.33 Abs); 0.005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
Stability of baseline (UV-VIS), %/hour **** | < 0,1 |
Light sources | Halogen lamp, Deuterium lamp, HgAr wavelength calibration verification lamp |
INTERFACE, DIMENSIONS AND WEIGHT | |
Interface | USB 2.0 |
Power consumption, Watt | 110 |
Power input | 110-220 VAC, 50-60 Hz |
Width x Depth x Height, mm | 680,0 х 440,0 х 360,0 (26 3/4 “ x 17 1/3 “ x 14 1/5”) |
Net weight, kg | 50 |
* provided maximum values for each individual geometrical parameter of lens. Final measurement capabilities of the instrument depend on the actual dimensions of particular lens. ** maximum size (diameter and length) of lens assembly which can be measured with LINZA 150 spectrophotometer *** provided for optimal signal-to-noise ratio **** after 1 hour warm-up time |
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