Wavefront Sensor
HASO4 Broadband
The HASO4 Broadband is the only wavefront sensor delivering lambda/100 rms absolute accuracy*, large dynamic, and high linearity over a very broad wavelength range. This unique feature is possible thanks to our advanced calibration process, high-quality hardware, and proprietary reconstruction software.
The HASO 4 Broadband offers high measurement performance, high resolution, and extended spectral calibration bandwidth. It is the most versatile wavefront sensor and is a great choice for the lab or industrial application. It has been used with success in the most demanding applications in optical metrology, microscopy and laser diagnostics.
HASO4 Broadband is delivered with WaveView, the 3rd generation of wavefront analysis software. With just a few clicks, you will get access to wavefront measurement, reconstruction etc . WaveView offers more than 150 functions and optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio and M².
WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 Broadband with any kind of OEM products and systems.
HASO4 FIRST
The HASO 4 FIRST delivers accurate, reliable, and fast measurement at the wavelength of your choice. This HASO is based on a camera offering the best industry standards in terms of reliability, and high wavefront measurement performance thanks to the unique characteristics coming with each of our products: factory calibration, advanced software, and high-quality hardware.
The HASO4 FIRST is a top choice for adaptive optics applications for microscopy or UHIL. It is also a very relevant option for OEM applications in optical metrology and beam diagnostics. Wavefront acquisition can be performed up to 99 Hz or in high-speed mode at 165 Hz. Either way, HASO4 FIRST offers reliable wavefront metrology for a large range of applications including fundamental research, prototype development, or quality control in production.
The HASO4 FIRST can be associated with WaveTune and our deformable mirrors ILAO Star or mirao52-e and any other deformable mirror available.
HASO4 FIRST is delivered with WaveView, the 3rd generation of our wavefront analysis software offering more than 150 functions and optional add-ons offering advanced determination of PSF, MTF, Strehl ratio and M². Available as an option, WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 FIRST into any custom systems. On request, customized software solutions, perfectly adapted to your application case can be developed. Our engineering team will ensure sustainable product integration and maintenance for a long product lifetime.
HASO4 VIS
The HASO 4 VIS delivers accurate, reliable, and fast measurement over the Visible (400-700nm) spectrum. This HASO offers 10nm rms absolute accuracy and large dynamic range over the visible range and comes at a very attractive price. This HASO is based on a camera offering the best industry standards in terms of reliability, and high wavefront measurement performance thanks to the unique characteristics coming with each of our products: factory calibration, advanced software, and high-quality hardware.
The HASO4 VIS is an interesting option for OEM applications or as a relevant first step in wavefront sensing.
HASO4 VIS is delivered with WaveView, the 3rd generation of our wavefront analysis software offering more than 150 functions and optional add-ons offering advanced determination of PSF, MTF, Strehl ratio, and M². Available as an option, WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 VIS into any custom systems. Customized software solutions, perfectly adapted to your application case can be developed on request.
HASO4 NIR
HASO4 NIR is the ideal tool for fiber coupling and, more generally, for aligning and characterize optical systems in the NIR (afocal, collimators, lenses, zoom, etc.). Exceptionally easy to integrate, they provide fast, accurate, and reliable measurements by taking advantage of the HASO family’s standard functionalities that customers have come to rely on, including absolute measurement, unequaled accuracy, and insensitivity to vibration at acquisition frequency up to 99 Hz.
HASO4 NIR is delivered with WaveView, the 3rd generation of wavefront analysis software. With just a few clicks, you will get access to wavefront measurement, reconstruction, etc. WaveView offers more than 150 functions and optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio, and M².
WaveKit (Software Development Kit – SDK) will enable you to interface the HASO4 NIR with any kind of OEM products and systems
HASO4 SWIR
HASO SWIR is the ideal tool for optical metrology, adaptive optics applications such as long-range communication.
HASO4 SWIR is delivered with WaveView, the 3rd generation of wavefront analysis software. With just a few clicks, you will get access to wavefront measurement, reconstruction etc. WaveView offers more than 150 functions and optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio and M².
WaveKit (Software Development Kit – SDK) will enable you to interface the HASO SWIRwith any kind of OEM products and systems.
HASO3 128 GE2
The HASO 3 128 GE2 offers the highest level of performance ever achieved with a wavefront sensor. It has been used with success in the most demanding applications in optical metrology and laser diagnostics, It is the ultimate candidate for demanding optical metrology applications in science or the industry.
HASO 3 128 GE2 is delivered with WaveView, the 3rd generation of wavefront analysis software. With just a few clicks, you will get access to wavefront measurement, reconstruction etc . WaveView offers more than 150 functions and optional add-ons enable you to go even further and calculate the PSF, MTF, Strehl ratio and the M².
WaveKit (or Software Development Kit – SDK) will enable you to interface the HASO 4 Broadband with any kind of OEM products and systems.
HASO4 FAST
Our new HASO4 Fast Shack-Hartmann wavefront sensors provide fast accurate and reliable measurements by combining a state of the art CMOS camera with the HASO line up standard functionalities that customers have been relying on for 2 decades : absolute measurement, unequalled accuracy, high linearity and insensitivity to vibration. The HASO4 Fast allows acquisition speed of up to 1 kHz and 16 x 16 sampling points.
When coupled with our WaveSuite software package, you can perform both zonal and modal wavefront reconstruction; calculate the PSF*, MTF* and Strehl ratio*; visualize the spot diagram; and obtain the M²* parameter. Adaptive optics users can take advantage of our WaveTune™ software package to control adaptive optics loops to compensate for atmospheric turbulence, optimize the focal spots of laser beams and Freespace communications.
HASO EUV
Imagine Optic’s HASO EUV wavefront sensor, developed in collaboration with the LOA and the SOLEIL synchrotron, is the only device of its kind available that offers you the extreme precision and direct measurement functionality needed for today’s demanding laboratory and industrial applications.
Designed and built in collaboration with our customers and with their needs as the top priority, the HASO EUV incorporates our patented rotated square technology to offer high spatial sampling and wide dynamic range, making it the ideal choice for HHG, EUV lithography, synchrotron and EUV-FEL beam analysis. When used for adaptive optics, the EUV becomes a powerful tool for that provides you with micro and nano-beam focusing, a high Strehl ratio and precise control of the focal spot shape.
When combined with our powerful and easy-to-use software packages, you can easily conduct wavefront acquisition and reconstruction. Additional add-on modules offer features including extended wavefront reconstruction and Point Spread Function (PSF), as well as a dynamic library that enables you to build your own software applications using this remarkable device.
HASO PACK
The educational package of wavefront sensor and software allows universities and other educational organizations to explain the methods used in wavefront metrology. By measuring the phase and intensity of the electromagnetic wave, the basic understanding of optics and its aberrations can be visualized and a deeper understanding of basic physical principles is achieved.
Custom HASO
Available HASO off-the-shelf respond to most of main stream and advanced wavefront sensing applications. Imagine Optic has also the capability to offer custom wavefront sensors and software for projects requiring some specifics metrological performance or specific environmental conditions. We have been involved in many demanding projects in both scientific research and industry, our solutions have always been successfully meeting their expectations.
HASO4 Broadband
| Aperture dimension | 7.0 x 5.2 mm² |
| Number of Microlens | 68 x 50 |
| Tilt dynamic range | > ± 3° |
| Focus dynamic range | ±0.026 m to ± ∞ |
| Repeatability (rms) | < λ/200 |
Absolute accuracy for λ between 400-600 nm Absolute accuracy for λ between 600-1100 nm | ≤ 6nm rms around λ/100 rms* |
| Spatial sampling | around 105 µm |
| Maximum acquisition frequency | 20 Hz |
| External trigger | TTL signal |
| Calibrated spectral range | 400-1100 nm |
| Dimensions / Weight | 46x57x57 mmᵌ/150g |
| Working temperature | 15-30° C |
| Interface / Power consumption | USB 3.0 / 2.9 W |
| Ethernet / 2.9 W | |
| Operating system | Windows 7 and 10 |
HASO4 FIRST
| Aperture dimension | 3.6 x 4.6 mm² | 1.8 x 2.3 mm² |
| Number of microlenses | 32 x 40 | 16 x 20 |
| Tilt dynamic range | > ± 3° (400 λ) | > ± 3° (200 λ) |
| Focus dynamic range | ± 0.018 m to ± ∞ (350 λ) | ± 0.018 m to ± ∞ (100 λ) |
| Focus dynamic range – maximum NA | 0.1 | 0.1 |
| Repeatability (rms) | < λ/200 | < λ/200 |
| Wavefront measurement accuracy in relative mode (rms)1 | around λ/150 | around λ/150 |
| Wavefront measurement accuracy in absolute mode (rms)² | around λ/100 | around λ/100 |
| Tilt measurement sensitivity (rms) | 5 μrad | 10 μrad |
| Focus measurement sensitivity (rms) | 3·10-3m-1 | 6·10-3m-1 |
| Spatial sampling | around 110 μm | around 110 μm |
| Maximum acquisition frequency | 99 Hz | 165 Hz |
| Working wavelength range | 400 – 1100 nm | |
| Calibrated wavelength | in the 400-1100 nm range, details on request3 | |
| Dimensions (LxWxH) / weight | 60mm x 48mm x 42mm /185g | |
| Working temperature | 15 – 30° C | |
| Interface / Power supply | USB 3.0 / 2.7 W via USB | |
| Operating system | Windows 7 and 10 | |
| WaveView metrology software | included | |
| External trigger | yes | |
HASO4 VIS
| Aperture dimension | 3.6 x 4.6 mm² | |
| Number of microlenses | 32 x 40 | |
| Tilt dynamic range | > ± 3° (400 λ) | |
| Focus dynamic range | ± 0.018 m to ± ∞ (350 λ) | |
| Focus dynamic range – maximum NA | 0.1 | |
| Repeatability (rms) | 7.5 nm | |
| Wavefront measurement accuracy in absolute mode (rms) | 10 nm | |
| Tilt measurement sensitivity (rms) | 5 μrad | |
| Focus measurement sensitivity (rms) | 3·10-3m-1 | |
| Spatial sampling | around 110 μm | |
| Maximum acquisition frequency | 99 Hz | |
| Working wavelength range | 400 – 700 nm | |
| Extended wavelength range | not available | |
| Dimensions (LxWxH) / weight | 60mm x 48mm x 42mm /185g | |
| Working temperature | 15 – 30° C | |
| Interface / Power supply | USB 3.0 / 2.7 W via USB | |
| Operating system | Windows 7 and 10 | |
| WaveView metrology software | included | |
| External trigger | yes | |
HASO4 NIR
| Aperture dimension | 3.6 x 4.5 mm² |
| Number of microlenses | 32 x 40 |
| Tilt dynamic range | > ± 3 ° |
| Focus dynamic range | ± 0.018 m to ± ∞ |
| Repeatability (rms) | < λ/70 |
| Wavefront measurement accuracy in absolute mode (rms)1 | around λ/35 |
| Tilt measurement sensitivity (rms) | 10 μrad |
| Spatial sampling | around 110 μm |
| Maximum acquisition frequency | 99 Hz |
| Wavelength range | 1500 – 1600 nm |
| Dimensions (LxWxH) / weight | 60mm x 48mm x 42mm / 185 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | USB3.0 / 2.7W via USB |
| Operating system | Windows 7 and 10 |
| External trigger | yes |
HASO4 SWIR
| Aperture dimension | 7.44 x 9.30 mm² |
| Number of microlenses | 32 x 40 |
| Tilt dynamic range | > ± 3 ° |
| Focus dynamic range | ± 0.042 m to ± ∞ |
| Repeatability (rms) | around λ/200 |
| Wavefront measurement accuracy in absolute mode (rms)1 | around λ/100 |
| Spatial sampling | around 232 μm |
| Maximum acquisition frequency | 99 Hz |
| Wavelength range | 0.9 – 1.7 µm |
| Dimensions / weight | 79 x 75 x 65 mm / 438 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | USB3.0 /< 5 W via USB |
| Operating system | Windows 7 and 10 |
| External trigger | yes |
| Minimum power2 | 0.3 pW |
HASO3 128 GE2
| Aperture dimension | 14.6 x 14.6 mm² |
| Number of microlenses | 128 x 128 |
| Tilt dynamic range | >±3° (1500 λ) |
| Focus dynamic range – minimum local radius of curvature | 15 mm |
| Focus dynamic range – maximum NA | > 0.1 |
| Repeatability (rms) | < λ/200 |
| Wavefront measurement accuracy in relative mode (rms)1 | around λ/150 |
| Wavefront measurement accuracy in absolute mode (rms)² | around λ/100 |
| Tilt measurement sensitivity (rms) | <1 µrad |
| Focus measurement sensitivity (rms) | 2.5·10-4 m-1 |
| Spatial sampling | around 110 µm |
| Maximum acquisition frequency (sequential acquisition) | 7.5 Hz |
| Processing frequency (CPU 3Ghz, 512 Mb RAM) | 5.0 Hz |
| Working wavelength range | 400 – 1100 nm |
| Calibrated wavelength range | A (400 – 600 nm), B (500 – 700 nm), C (630 – 900 nm), D (800 – 1100 nm) |
| Extended wavelength range* | A+ (400 – 700 nm) and B+ (500 – 900 nm) |
| Dimensions / weight | 115 x 51 x 60 mm / 400 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | Giga Ethernet / 12 V / 6 W |
| Operating system | Windows 7 and 10 |
| HASOv3 metrology software | included |
| External trigger | yes |
HASO4 FAST
| Aperture dimension | 1.19 x 1.19 mm² |
| Number of microlenses | 16 x 16 |
| Tilt dynamic range | >±3° |
| Focus dynamic range – minimum local radius of curvature | ± 0.008 m |
| Focus dynamic range – maximum NA | 0.1 |
| Repeatability (rms) | λ/200 |
| Absolute wavefront measurement accuracy for 400-600nm (rms)1 | 6 nm |
| Absolute wavefront measurement accuracy for 600-900nm (rms)1 | λ/100 |
| Spatial sampling | 74.4 µm |
| Maximum acquisition frequency (sequential acquisition) | 1 kHz |
| Dimensions (LxWxH) / weight | 60mm x 48mm x 42mm / 185 g |
| Working temperature | 15 – 30° C |
| Interface / Power supply | USB3.0 / 3 W via USB |
| Operating system | Windows 7 and 10 |
| WaveView metrology software | included |
| External trigger | included |
HASO EUV
| Aperture dimension | 13 x 13 mm² | D=20 mm |
| Number of Subapertures | 72 x 72 | 110 across diameter |
| Curvature dynamic range | 0.5 m to ∞ (diverging) | 0.1m m to ∞ |
| Repeatability | about λ/200 RMS | about λ/200 RMS |
| Wavefront measurement accuracy in absolute mode 1 | λ/50 @ 13.5nm RMS | about λ/50 @ 30nm RMS |
| Wavefront measurement accuracy in relative mode ² | about λ/100 RMS | < λ/100 RMS |
| Tilt measurement sensitivity | 0.05 µrad RMS | 0.1 µrad RMS |
| Spatial beam sampling step | about 180 µm | about 150 µm |
| Minimum readout time | about 600 ms (@2 MHz digitization) | about 2s |
| Working photon energy (wavelength)3 | 30 eV – 300 eV (4 nm – 40 nm) | 27.6-124eV (10 nm – 45 nm) |
| Calibrated wavelength | user specific | user specific |
| Length | 270 mm | 170mm |
| Compliant vacuum (hydrocarbon free, compatible with clean vacuum) | 10-7 mbar | up to 10-6 Torr* * Requires dynamic vacuum |
| Interface / Power supply | USB / included | USB / included |
| Operating system | Windows 10 | Windows 10 |
| WaveView metrology software | included | included |
| External trigger | Possible | Possible |
HASO PACK
HASO PACK FOR UNIVERSITIES
Content of product delivery :
- HASO4 VIS
- Acquisition card
- USB 3.0 cable
- HASO WFS documentation
- Calibration certificate
- WaveView software including:
- MTF software plugin
- PSF softwareplugin
Custom HASO
Examples of delivered specifications are
–λ/1000 rms measurement accuracy
– 50 nrad tilt sensitivity
– 5000 photons/sec needed in the pupil
– 1 nm wavelength wavefront detection
– 200λ PtV of spherical aberration detection
– detection at 1E-7 mbar
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