Beam Profilers

We offer a variety of laser beam profiling solutions to bring the photonics industry high-quality, affordable, and reliable products.

  • Beam Profiling Cameras

These CMOS and VO microbolometer-based cameras cover a broad range of different wavelengths from 190 nm to 16 μm.

  • Scanning Slit Beam Profilers

We offer two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus, and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.

  • Specialised Beam Profiler Systems

In addition to beam profiling cameras and scanning slit beam profilers, we offer specialised beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm in the image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.

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