Avalanche Photodiode (APD)
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
Si-APDs are suitable for the spectral range from 225nm to 1100nm.
The SAP series silicon APDs are primarily used in photon counting. This series features the highest efficiency and lowest dark current rates.
This detector was developed specifically for biomedical applications in which the smallest signals in the short-wave UV/blue spectral range have to be detected.
The InGaAs APDs detect in the spectral range from 1100nm to 1700nm. IAG series APDs exhibit particularly high damage threshold values. Both come packaged in a TO-46 housing.
APD Array enables new applications in LIDAR and ACC, typically used in Time-of-Flight sensors for distance measurement.
These are APDs with matched, integrated pre-amplifier in compact hermetic packages.
Fast and reliable detection of light. In the APD module, the driver for operating the APDs is already included.
Miniature high-voltage modules are particularly suitable for APDs and PIN photodiodes.
With a resolution of 2 x 192 pixels and noise < 50 cps, this 2D array opens up new perspectives for LiDAR-based systems in the automotive industry or gesture recognition.
With the evaluation board, the SPAD sensor for high-resolution imaging applications can be tested quickly and easily. A USB 2.0 interface facilitates data exchange with the application software.
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