IR Eillipsometer

Infrared Ellipsometry System is Wavelength’s newly developed measurement instrument which measures the amplitude and phase from a reflected laser beam in a CO2 RF Laser.

The amplitude and phase of the polarization will be correlated the coating properties through a series of coating test. A software user-interface has been built to extract the polarization information, archive log and provide the database of the coating properties.

Ellipsometer

 

Specifications

PN#: ELPM-001

Ellipsometer

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